TOYOTech, Sharp Display Technology Corporation, and the Japan Advanced Institute of Science and Technology have jointly developed a groundbreaking measurement technology designed to analyze the behavior of Organic Light Emitting Diodes (OLEDs) under extremely low luminance conditions.
The newly developed method measures the difference between the onset voltage of current change and the emission voltage. These factors are closely connected to OLED degradation, making this technology a crucial tool for understanding display Mura, a defect that becomes apparent at low luminance levels or as OLEDs age.
OLEDs, which emit light when a voltage is applied to organic compounds, are used in a wide variety of displays, including TVs and smartphones. They are inherently thinner, lighter, and more energy-efficient than traditional Liquid Crystal Displays (LCDs). OLEDs offer a simpler structure due to their self-emissive properties, eliminating the need for a backlight. OLEDs are created through the stacking of multiple thin film layers and their performance is dependent on optimized deposition conditions. Traditionally, OLED characteristics have been evaluated using J-V-L (current density-voltage-luminance) measurements, which track current and luminance as voltage increases. However, J-V-L technology’s effectiveness has been limited in detecting small currents and low luminance levels at the start of OLED light emission.
The new technology addresses these challenges by measuring both the small displacement current flowing through the OLED and the emission intensity. It uses a highly sensitive silicon photodiode to accurately detect the difference between the onset voltage of current change and the start of light emission. The system can also measure current and luminance across a wide range of levels, from extremely low to high, providing a comprehensive analysis of display Mura. This advance will contribute to the further enhancement of OLED display performance.
This new measurement technology was unveiled at the International Meeting on Information Display Conference 2024 (IMID2024) held in Korea from August 20-23. TOYOTech will officially launch the DCM1000 DC-JVL Measurement System for global customers on October 1st, 2024.
For more information, visit https://toyotechus.com/lab-dcm1000/ or contact info@toyotechus.com.
