TOYOTech, in collaboration with Sharp Display Technology Corporation and the Japan Advanced Institute of Science and Technology (JAIST), has announced the development of a groundbreaking measurement technology. The new technology is designed to analyze the behavior of Organic Light Emitting Diodes (OLEDs) under extremely low luminance conditions. This advancement promises to significantly aid in the study and improvement of OLED performance.
This new technology, developed jointly by the three entities, accurately measures the difference between the onset voltage of current and light emission. This is crucial, as these factors are directly linked to OLED degradation. The technology is expected to play an essential role in understanding and mitigating “Mura,” a visual defect that can appear in OLED displays, particularly at low luminance levels or as the displays age.
OLEDs function by emitting light when a voltage is applied to organic compounds. This self-emissive property allows for the creation of displays that are thinner, lighter, and more energy-efficient than traditional Liquid Crystal Displays (LCDs). Unlike LCDs, OLEDs do not require a backlight, leading to a simpler structure. However, the performance of OLEDs depends heavily on optimizing the deposition conditions of the multiple thin film layers that make up the display.
Traditionally, OLED characteristics have been evaluated using J-V-L (current density-voltage-luminance) measurements. This method tracks the current and light emitted as voltage is increased. However, J-V-L technology has proven limited in terms of detecting the small currents and light emission levels that occur at the beginning of the process. The newly developed technology overcomes these limitations by measuring both the small displacement current flowing through the OLED and the light intensity, using a highly sensitive silicon photodiode.
This system allows for the precise measurement of the difference between the onset voltage of current change and the start of light emission. Furthermore, it can measure current and luminance across a wide range, from extremely low to very high light output levels. This broad range allows for a comprehensive analysis of display Mura and promises to contribute to the ongoing enhancement of OLED display performance.
The technology was presented at the International Meeting on Information Display Conference 2024 (IMID2024) in Korea, which took place from August 20-23. TOYOTech will officially launch the DCM1000 DC-JVL Measurement System globally on October 1st, 2024.
About TOYOTech
TOYOTech is a wholly-owned subsidiary of TOYO Corporation. The company provides its customers in the US and other countries with products developed by TOYO Corporation, incorporating decades of accumulated know-how and technologies. TOYOTech also offers its own unique products, including test and measurement solutions for applications in the automotive, new materials, ICT, and EMC sectors. Additionally, TOYOTech actively seeks out new technologies and information within Silicon Valley to further innovation, collaborating with startups and exploring M&A opportunities. For more information, visit the company’s website.
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