Nidec Advance Technology Corporation will be present at SEMICON Japan 2024, a prominent industry event held at the Tokyo International Exhibition Center from December 11th to 13th, 2024.
At the exhibition, Nidec Advance Technology will showcase its advanced inspection and testing solutions designed for the semiconductor and automotive industries. These will include equipment for inspecting power semiconductors like IGBT and SiC modules. They will also present drive motor test benches designed for electric vehicles (EVs), hybrid electric vehicles (HEVs), and other automotive applications, probe cards used for wafer inspections, along with other innovative solutions.
Featured exhibits will include the GATS Series, an electrical inspection system for semiconductor package substrates, and optical inspection equipment designed for 2D and 3D measurements of microscopic bumps. These products highlight Nidec Advance Technology’s expertise in measurement technologies. Utilizing its established inspection technologies, the company plans to demonstrate its latest advanced inspection solutions as well as new technologies aimed at contributing to the future of these sectors.
About SEMICON Japan 2024
- Dates: Wednesday, December 11 – Friday, December 13, 2024
- Venue: East Exhibition Hall, Tokyo Big Sight
- Booth: 2Hall 2011
- Official Website: https://www.semiconjapan.org/en/
Nidec Advance Technology Exhibits
Nidec Advance Technology will showcase an array of products, including:
- NATS-1000/1700 Series (inspection equipment for IGBT and SiC modules)
- TDAS Series (test bench for EV drive motors)
- RWi Series (automatic wafer bump inspection system)
- GATS Series (electrical inspection system for semiconductor package substrates)
- R-700 Series (AC/DC multi-tester)
- Probe cards for semiconductor wafer inspections
- Pin probes for ultra-high-precision inspections
- NATS-1300 Series (KGD testing equipment)
- NATS-8000 Series (dynamic reliability testing equipment for power semiconductor modules)
- Reference inverters
- NSW Series (3D optical inspection equipment)
