Nidec Advance Technology Corporation will be exhibiting at SEMICON KOREA 2025, an industry event being held at the COEX Convention Center in Seoul, South Korea, from February 19th to 21st, 2025. The company plans to showcase a range of advanced solutions for the semiconductor and vehicular sectors.
Nidec Advance Technology will feature its state-of-the-art inspection and testing solutions, demonstrating its expertise in precision measurement technologies. Highlights of the exhibition will include power semiconductor inspection equipment, designed for IGBT and SiC components, and test benches engineered to evaluate the performance of drive motors for electric vehicles (EVs), hybrid electric vehicles (HEVs), and other vehicle types.
Also on display will be a probe card, a critical wafer inspection tool developed and manufactured by Nidec SV Probe Corporation, a subsidiary of Nidec. This tool, alongside other key offerings, reflects the company’s commitment to innovation and quality.
Further showcasing Nidec Advance Technology’s capabilities will be its semiconductor probe cards and semiconductor package substrate electrical and power semiconductor electrical inspection systems—the GATS and NATS series, respectively. These offerings epitomize the company’s core competency in precision measuring for the semiconductor industry.
Based on inspection technologies, Nidec Advance Technology will also propose some new products, technologies, and cutting-edge solutions designed to drive the future of these industries. The company’s presence at the event underscores its commitment to furthering technological advancements and meeting the evolving needs of its customers.
About SEMICON KOREA 2025:
- Dates: Wednesday, February 19 – Friday, February 21, 2025
- Venue: COEX Convention Center, Seoul, South Korea
- Booth: C600, Hall C on the third floor
- Official Website: https://www.semiconkorea.org/en
Nidec Advance Technology Exhibit Details:
At SEMICON KOREA 2025, Nidec’s exhibit will be featuring:
- High-voltage, pressurized-structure probe card
- High-temperature/high-current probe card
- 2D-MEMS probe card
- Insulation, static, and dynamic characteristics inspection equipment for IGBT and SiC modules (NATS-1000/1700 series)
- KGD (Known Good Die) testing equipment (NATS-1300 series)
- Dynamic reliability testing equipment for power semiconductor modules (NATS-8000 series)
- Reference inverter
- Test bench for EV drive motors (TDAS series)
- Semiconductor package substrate electrical inspection system (GATS-7000 series)
- Large substrate electrical inspection system for AI servers (GATS-8360)
- AC/DC multi-tester (R-700 series)
- Pin probe for ultra-high-precision inspections
